32 results
New Frontiers in Cryo-electron Tomography with Zernike Phase Contrast Imaging for Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1072-1073
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- August 2008
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Atomic Resolution Elemental Maps by Core Level EELS Using Cs Corrected STEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1372-1373
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- August 2008
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An Application of a Thin Film Preparation Apparatus with a Broad Ar Ion Beam (Ion Slicer) to Corrosion of a Gold Plated Copper Alloy
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1092-1093
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- August 2007
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Advances and Challenges in Electron Tomography
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1336-1337
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- August 2007
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Three-Dimensional Magnetic Domain Analysis by Lorentz Tomography
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 984-985
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- August 2006
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From Macromolecules to Cells: Progress and Challenges in Mesoscale Electron Tomography
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1538-1539
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- August 2006
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Atomic Resolution Elemental Map of EELS with a Cs Corrected STEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1150-1151
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- August 2006
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A Newly Developed PC controlled 200kV FE-TEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 1272-1273
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- August 2003
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Observation of cross sectional semiconductor sample with newly developed SEI/STEM/TEM microscope
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 22 July 2003, pp. 494-495
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- August 2003
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A New High-Resolution Electron Microscope with Easy Operation System for Nano Analysis
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 1106-1107
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- August 2002
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Development of An 0.2eV Energy Resolution Analytical Electron Microscope
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 November 2002, pp. 68-69
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- August 2002
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Microscopy in the Real World: A Manufacturer's Perspective
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- Microscopy Today / Volume 10 / Issue 3 / May 2002
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- 14 March 2018, pp. 20-23
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- May 2002
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Microscopy in the Real World: A Manufacturer’s Perspective
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 528-529
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- August 2001
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The ORNL Aberration-Corrected STEM/TEM Project
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
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- 02 July 2020, pp. 906-907
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- August 2001
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A History of ESEM in 2.5 Chapters
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 774-775
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- August 2001
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Computer Controlled High-Throughput Integration System: FasTEM
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 1144-1145
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- August 2000
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Elemental Mapping of Materials Using Omega Filter and Imaging Plate
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
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- 02 July 2020, pp. 216-217
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- August 2000
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Pre-Martensitic State in a Ti50Ni48Fe2 Alloy Studied by Electron Microscopy with Energy-Filtering
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 874-875
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- August 1999
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Energy Filtering Imaging Of Thick Biological Specimens With In-Column "Omega"-Filter Microscopes.
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 394-395
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- July 1998
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Compositional Characterization of an O-N-O Layer in a Dram Using FE-(S)TEM And EELS
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
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- 02 July 2020, pp. 150-151
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- July 1998
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